Gentle ions for cryo-FIB milling
Authors
- X. Chu
- M. Kudryashev
Journal
- Structure
Citation
- Structure 31 (10): 1147-1148
Abstract
Cryo-EM imaging of vitreous samples is limited to a few hundred nanometers in thickness. Focused ion beams can mill windows into cells and tissues for imaging, but they damage biological samples. In this issue of Structure, Yang et al. (2023) quantitatively describe this damage and suggest ways to minimize it.